Electron scanning microscope

Hitachi S-3000 scanning electron microscope has an acceleration voltage of 0.3 kV-30kV, a magnification of 15X-300,000X, a secondary electron resolution of 3nm, a backscattered electron resolution of 4.5nm, a working distance of 5-35mm, and two working modes of high and low vacuum. It can be used to observe the secondary electron image and backscattered electron image of bulk or powder samples, and to observe the secondary electron image of the fracture.